• Registration Log In
  • For Libraries
  • For Publication
  • Open Access
  • Downloads
  • About Us
  • Contact Us
For Libraries For Publication Open Access Downloads About Us Contact Us
Paper Titles
Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au69+
p.413
Ion Channeling Study of GaN Single Crystals
p.419
Highly Focused Ion Beams in Integrated Circuit Testing
p.427
Atomic Structure and Electrical Properties of a Supertip Gas Field-Ion Source
p.433
High Energy Ion Microprobes: Where are we going?
p.439
Application of Highly Focused Ion Beams
p.445
Use of an Ultra-High Resolution Magnetic Spectrograph for Materials Research
p.451
Ion Beam Analysis with Monolayer Depth Resolution
p.459
Applications of Ion Track Filters
p.467
HomeMaterials Science ForumMaterials Science Forum Vols. 248-249High Energy Ion Microprobes: Where are we going?

High Energy Ion Microprobes: Where are we going?

Article Preview
Article Preview
Article Preview

Abstract:

Access through your institution
You might also be interested in these eBooks
Materials Science Applications of Ion Beam Techniques View Preview

Info:

Periodical:

Materials Science Forum (Volumes 248-249)

Pages:

439-444

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249.439

Citation:

Cite this paper

Online since:

May 1997

Authors:

T. Butz, R.-H. Flagmeyer

Keywords:

Ion Beam Analysis, Nuclear Microprobe

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1997 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

References

This article has no references.

Cited by
Related Articles
Citation
Add To Cart

Paper price:

After payment, you will receive an email with instructions and a link to download the purchased paper.

You may also check the possible access via personal account by logging in or/and check access through your institution.

Back
Add To Cart

This paper has been added to your cart

Back To Cart
  • For Libraries
  • For Publication
  • Insights
  • Downloads
  • About Us
  • Policy & Ethics
  • Contact Us
  • Imprint
  • Privacy Policy
  • Sitemap
  • All Conferences
  • All Special Issues
  • All News
  • Open Access Partners

© 2025 Trans Tech Publications Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies. For open access content, terms of the Creative Commons licensing CC-BY are applied.
Scientific.Net is a registered trademark of Trans Tech Publications Ltd.