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Vol. 250
Materials Science Forum
Vols. 248-249
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Vol. 247
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Materials Science Forum Vols. 248-249

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.248-249

ToC:

Table of Contents

Paper Title Page

Heavy Ion Recoil Time of Flight Method for Materials Analysis
Authors: D.D. Cohen, N. Dytlewski, J. Martin, R. Siegele
333
Transition-Metal Silicide Layer Formation, the Phases of Mixed Silicides
Authors: I. Dézsi, Cs. Fetzer, I.S. Szűcs, J. Dekoster, G. Langouche
339
Composition and Structure of Codeposited Layers on Plasma Facing Components in Controlled Fusion Devices: Ion Beam and Microscopy Studies
Authors: M. Rubel, P. Wienhold
345
Ion-Beam Analysis of Solar-Cell Materials
Authors: H. Metzner
351
Evaluation of Coatings Produced by Low-Energy Ion Assisted Deposition of Co on Silicon
Authors: I.S. Tashlykov, G. Carter, J.S. Colligon
357
Application of the Combined Channeling Method at Higher Ion Energies on Cyclotron
Authors: F. Ditrói, J.D. Meyer, R.W. Michelmann, Klaus Bethge
361
Corrosion Depth Profiles by Rutherford Backscattering Spectrometry and Synchrotron X-Ray Reflrectometry
Authors: E. Szilágyi, L. Bottyán, L. Deák, E. Gerdau, V.N. Gittsovich, A. Gróf, E. Kótai, O. Leupold, D.L. Nagy, V.G. Semenov
365
Hydrogen Elastic Recoil Detection Depth Resolution and Sensitivity as a Function of Sample Composition
Authors: L.S. Wielunski, G.L. Harding, A. Bendavid
369
Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
Authors: E. Szilágyi, Z. Hajnal, F. Pászti, O. Buiu, G. Craciun, C. Cobianu, C. Savaniu, É. Vázsonyi
373
Combining RBS and FTIR Spectroscopy for the Ge Analysis in Si1-xGex Single Crystals
Authors: A. Gerhardt, J. Donecker, B. Selle, Jürgen Wollweber
377

Showing 61 to 70 of 88 Paper Titles

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