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Vols. 255-257

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HomeMaterials Science ForumMaterials Science Forum Vols. 255-257

Materials Science Forum Vols. 255-257

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.255-257

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Paper Title Page

Time-of-Flight Spectroscopy of Positronium Emission from SiO₂ Surface

Authors: Y. Morinaka, Yasuyuki Nagashima, Yasuyoshi Nagai, Takeo Hyodo, Toshikazu Kurihara, T. Shidara, K. Nakahara

689

Interfacial Mixing in Al-Ge Thin Film Junction Studied by Variable Low Energy Positron Beam

Authors: G. Venugopal Rao, G. Raghavan, G. Amarendra, A.K. Tyagi, B. Viswanathan

692

Intense Positron Source at the Munich Research Reactor

Authors: M. Springer, Gottfried Kögel, B. Strasser, Werner Triftshäuser, K. Schreckenbach

695

"Hydraulic" Slow-Positron Gun

Authors: R.I. Grynszpan, M. Bréart, A. Buisson, J.C. Jauréguy

698

Defect Study of Heavily n-Type Doped III-V Compound Semiconductors by Means of Pulsed Positron Beam Measurement

Authors: Yang Koo Cho, J.Y. Leem, C. Lee, S.K. Noh, Ryoichi Suzuki, T. Odaira, Tomohisa Mikado

701

Surface Properties of Polymers Studied by Slow Positron Annihilation Spectroscopy

Authors: R. Zhang, H. Cao, J.P. Yuan, C.M. Huang, Qi Yi Zhang, T.C. Sandreczki, B. Nielsen, P. Asoka-Kumar, Ryoichi Suzuki, Toshiyuki Ohdaira, Yan Ching Jean

704

The Study of Secondary Electrons and Redistributed Primaries (Electrons and Positrons) from Ge(100) Surface Utilizing the Electron and the Positron Beams

Authors: E. Jung, R. Venkataraman, S. Starnes, Alex H. Weiss

708

Experimental Determination of Positron Related Surface Characteristics of 6H-SiC

Authors: A. Nangia, J.H. Kim, Alex H. Weiss, Gerhard Brauer

711

Positron Lifetime Study on Semiconductor Thin Films

Authors: Ryoichi Suzuki, Toshiyuki Ohdaira, Akira Uedono, Shoji Ishibashi, Akihisa Matsuda, Sadafumi Yoshida, Yuuki Ishida, S. Niki, P.J. Fons, Tomohisa Mikado, T. Yamazaki, Shoichiro Tanigawa, Yang Koo Cho

714

Characterization of Defects at the Si/SiO₂ Interface of a Polysilicon Gated MOS System by Monoenergetic Positrons

Authors: M. Clement, J.M.M. de Nijs, H. Schut, A. van Veen, P. Balk

718