Transient Lattice Vibration Induced by Successive Carrier Captures at a Deep-Level Defect and the Effect on Defect Reactions

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Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

659-664

DOI:

10.4028/www.scientific.net/MSF.258-263.659

Citation:

Y. Shinozuka and T. Karatsu, "Transient Lattice Vibration Induced by Successive Carrier Captures at a Deep-Level Defect and the Effect on Defect Reactions", Materials Science Forum, Vols. 258-263, pp. 659-664, 1997

Online since:

December 1997

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