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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263The Jahn-Teller Effect and the Structure of...

The Jahn-Teller Effect and the Structure of Monovacancies in Si, SiC and C

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

653-658

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.653

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Online since:

December 1997

Authors:

A. Zywietz, J. Furthmüller, Friedhelm Bechstedt

Keywords:

C, First-Principle Calculations, Jahn-Teller Effect, Silicon, Silicon Carbide (SiC), Vacancy

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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