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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Electrically Detected Magnetic Resonance at...

Electrically Detected Magnetic Resonance at Different Microwave Frequencies

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

963-968

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.963

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Online since:

December 1997

Authors:

M.S. Brandt, M.W. Bayerl, N.M. Reinacher, T. Wimbauer, M. Stutzmann

Keywords:

a-Si:H, Electrically Detected Magnetic Resonance, GaAs

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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