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HomeMaterials Science ForumMaterials Science Forum Vols. 264-268Characterization of Power MESFETs on 4h-SiC...

Characterization of Power MESFETs on 4h-SiC Conductive and Semi-Insulating Wafers

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Periodical:

Materials Science Forum (Volumes 264-268)

Pages:

949-952

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.264-268.949

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Online since:

February 1998

Authors:

Olivier Noblanc, C. Arnodof, E. Chartier, Christian Brylinski

Keywords:

DC and RF Characterization, MESFET, Thermal and Storage Characterization

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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