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HomeMaterials Science ForumMaterials Science Forum Vols. 287-288A New Method for the Optical Characterization of...

A New Method for the Optical Characterization of Inhomogeneous Thin Films Based Only on Spectroscopic Reflection Measurements

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Periodical:

Materials Science Forum (Volumes 287-288)

Pages:

363-366

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.287-288.363

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Online since:

August 1998

Authors:

J.J. Ruiz-Pérez, E. Márquez, J.M. González-Leal, D. Jiménez-Garay, D. Minkov

Keywords:

Optical Characterization, Optical Property, Thin Film

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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