A New Method for the Optical Characterization of Inhomogeneous Thin Films Based Only on Spectroscopic Reflection Measurements

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Periodical:

Materials Science Forum (Volumes 287-288)

Edited by:

Horst Hoffmann

Pages:

363-366

DOI:

10.4028/www.scientific.net/MSF.287-288.363

Citation:

J.J. Ruiz-Pérez et al., "A New Method for the Optical Characterization of Inhomogeneous Thin Films Based Only on Spectroscopic Reflection Measurements", Materials Science Forum, Vols. 287-288, pp. 363-366, 1998

Online since:

August 1998

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$35.00

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