Structural Invetigations of Sputtered Thin Films with X-Ray Absorption Techniques

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Periodical:

Materials Science Forum (Volumes 287-288)

Edited by:

Horst Hoffmann

Pages:

357-360

DOI:

10.4028/www.scientific.net/MSF.287-288.357

Citation:

D. Lützenkirchen-Hecht et al., "Structural Invetigations of Sputtered Thin Films with X-Ray Absorption Techniques", Materials Science Forum, Vols. 287-288, pp. 357-360, 1998

Online since:

August 1998

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$35.00

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