Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)
p.353
p.353
High Resolution Electron Energy Loss Spectroscopy of √ 3x√ 3 6H-SiC(0001)
p.357
p.357
In-Situ RHEED Analysis During α-SiC Homoepitaxy on (0001)Si- and (000-1)C-Faces by Gas Source Molecular Beam Epitaxy
p.361
p.361
(10-10)– and (11-20)–Surfaces in 2H–, 4H– and 6H–SiC
p.365
p.365
Theory of Structural and Electronic Properties of Cubic SiC Surfaces
p.369
p.369
Characterization of Anisotropic Step-bunching on as-grown SiC Surfaces
p.375
p.375
Observation of Macrostep Formation on the (0001) Facet of Bulk SiC Crystals
p.379
p.379
Silicate Monolayers on the Hexagonal Surfaces of 4H- and 6H-SiC
p.383
p.383
Electronic and Atomic Structure of an Ordered Silicate Adlayer on Hexagonal SiC
p.387
p.387
Theory of Structural and Electronic Properties of Cubic SiC Surfaces
Abstract:
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Periodical:
Materials Science Forum (Volumes 338-342)
Pages:
369-374
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Online since:
May 2000
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© 2000 Trans Tech Publications Ltd. All Rights Reserved
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