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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Electronic and Atomic Structure of an Ordered...

Electronic and Atomic Structure of an Ordered Silicate Adlayer on Hexagonal SiC

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

387-390

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.387

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Online since:

May 2000

Authors:

M. Hollering, N. Sieber, F. Maier, Jürgen Ristein, Lothar Ley, J.D. Riley, R.C.G. Leckey, F. Leisenberger, F. Netzer

Keywords:

Angle Resolved Photoelectron Spectroscopy, Silicon Oxide (SiO), Surface States, X-Ray Induced Photoelectron Spectroscopy

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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