Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)

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Periodical:

Materials Science Forum (Volumes 338-342)

Edited by:

Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer

Pages:

353-356

DOI:

10.4028/www.scientific.net/MSF.338-342.353

Citation:

J.D. Hartman et al., "Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)", Materials Science Forum, Vols. 338-342, pp. 353-356, 2000

Online since:

May 2000

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$35.00

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