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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Photo-Emission Electron Microscopy (PEEM) of...

Photo-Emission Electron Microscopy (PEEM) of Cleaned and Etched 6H-SiC(0001)

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

353-356

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.353

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Online since:

May 2000

Authors:

J.D. Hartman, K. Naniwae, C. Petrich, V. Ramachandran, R.M. Feenstra, Robert J. Nemanich, Robert F. Davis

Keywords:

Free Electron Laser, Hydrogen Etching, PEEM, Photo Emisson Electron Microscopy, Silicon Carbide (SiC), Surface Preparation, Surface Reconstruction

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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