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HomeMaterials Science ForumMaterials Science Forum Vols. 363-365Defect Identification with Positrons

Defect Identification with Positrons

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Periodical:

Materials Science Forum (Volumes 363-365)

Pages:

25-29

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.363-365.25

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Online since:

April 2001

Authors:

C.D. Beling, S. Fung

Keywords:

6H-SiC, Deep-Level Transient Spectroscopy, Doppler Broadening Spectroscopy, Double Doppler Broadening Spectroscopy, Lifetime Spectroscopy, Positron Deep Level Transient Spectroscopy, α-Si:H

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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