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HomeMaterials Science ForumMaterials Science Forum Vols. 363-365Bulk Studies of Defects in Semiconductors

Bulk Studies of Defects in Semiconductors

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Periodical:

Materials Science Forum (Volumes 363-365)

Pages:

30-34

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.363-365.30

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Online since:

April 2001

Authors:

Peter Mascher

Keywords:

Cd_1-xZn_xTe (CZT), Crystallization, Positron Lifetime, β-Ga₂O₃

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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