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HomeMaterials Science ForumMaterials Science Forum Vols. 363-365Detailed Microscopic Defect Identification in GaAs

Detailed Microscopic Defect Identification in GaAs

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Periodical:

Materials Science Forum (Volumes 363-365)

Pages:

76-78

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.363-365.76

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Online since:

April 2001

Authors:

J. Gebauer, T.E.M. Staab, F. Redmann, Reinhard Krause-Rehberg

Keywords:

Calculation of Annihilation Parameters, Doppler Broadening Coincidence Spectroscopy, Ga Vacancy Donor Complexes, Gallium Arsenide (GaAs)

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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