Detailed Microscopic Defect Identification in GaAs

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Periodical:

Materials Science Forum (Volumes 363-365)

Edited by:

Werner Triftshäuser, Gottfried Kögel and Peter Sperr

Pages:

76-78

Citation:

J. Gebauer et al., "Detailed Microscopic Defect Identification in GaAs", Materials Science Forum, Vols. 363-365, pp. 76-78, 2001

Online since:

April 2001

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