Native and Irradiation-Induced Defects in SiO2 Structures Studied by Positron Annihilation Techniques

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Periodical:

Materials Science Forum (Volumes 363-365)

Edited by:

Werner Triftshäuser, Gottfried Kögel and Peter Sperr

Pages:

64-66

DOI:

10.4028/www.scientific.net/MSF.363-365.64

Citation:

A. Rivera et al., "Native and Irradiation-Induced Defects in SiO2 Structures Studied by Positron Annihilation Techniques", Materials Science Forum, Vols. 363-365, pp. 64-66, 2001

Online since:

April 2001

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$35.00

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