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HomeMaterials Science ForumMaterials Science Forum Vols. 363-365Native and Irradiation-Induced Defects in SiO2...

Native and Irradiation-Induced Defects in SiO₂ Structures Studied by Positron Annihilation Techniques

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Periodical:

Materials Science Forum (Volumes 363-365)

Pages:

64-66

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.363-365.64

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Online since:

April 2001

Authors:

A. Rivera, I. Montilla, A. Alba García, R. Escobar Galindo, C.V. Falub, A. van Veen, H. Schut, J.M.M. de Nijs, P. Balk

Keywords:

2D-ACAR, Deuterium Implantation, Doppler Broadening, Positron Lifetime, Positronium, SIMOX, SOI

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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