Identification of Vacancies on each Sublattice of SiC by Coincident Doppler Broadening of the Positron Annihilation Photons after Electron Irradiation

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 363-365)

Edited by:

Werner Triftshäuser, Gottfried Kögel and Peter Sperr

Pages:

70-72

DOI:

10.4028/www.scientific.net/MSF.363-365.70

Citation:

M.A. Müller et al., "Identification of Vacancies on each Sublattice of SiC by Coincident Doppler Broadening of the Positron Annihilation Photons after Electron Irradiation", Materials Science Forum, Vols. 363-365, pp. 70-72, 2001

Online since:

April 2001

Export:

Price:

$35.00

In order to see related information, you need to Login.