Photoluminescence and Transmision Electron Microscopy of Defects in SiC Grown on Si

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Periodical:

Materials Science Forum (Volumes 38-41)

Edited by:

G. Ferenczi

Pages:

1433-1438

DOI:

10.4028/www.scientific.net/MSF.38-41.1433

Citation:

W. J. Choyke et al., "Photoluminescence and Transmision Electron Microscopy of Defects in SiC Grown on Si", Materials Science Forum, Vols. 38-41, pp. 1433-1438, 1989

Online since:

January 1991

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$35.00

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