Paper Titles

Screening Effects and Density of States of Shallow Impurities in GaAs-(Ga,Al)As Quantum-Well Wires
p.1415

Transient Spectroscopy on Individual Defect Levels
p.1421

Pressure Dependence of Schottky Barrier Height at Pt/GaAs Interface
p.1427

Photoluminescence and Transmision Electron Microscopy of Defects in SiC Grown on Si
p.1433

Deep Levels in GaAs Mesfets
p.1439

Defects in MOS Technologies
p.1445

Lattice Deformation and Defect Structure of GaAs/Native Oxide Interfaces
p.1451

Influence of the Surface Layer Defects on the Conduction Mechanism in Semi-Insulating Gallium Arsenide
p.1457

Investigation of Trapping Properities in Simox Films by Photo-Induced Current Transient Spectroscopy
p.1463

HomeMaterials Science ForumMaterials Science Forum Vols. 38-41Deep Levels in GaAs Mesfets

Deep Levels in GaAs Mesfets

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Defects in Semiconductors 15

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Periodical:

Materials Science Forum (Volumes 38-41)

Pages:

1439-1444

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.38-41.1439

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Online since:

January 1989

Authors:

P. Macháč, V. Pantucek, J. Merta

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© 1989 Trans Tech Publications Ltd. All Rights Reserved

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