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HomeMaterials Science ForumMaterials Science Forum Vols. 38-41Investigation of Trapping Properities in Simox...

Investigation of Trapping Properities in Simox Films by Photo-Induced Current Transient Spectroscopy

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Defects in Semiconductors 15

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Periodical:

Materials Science Forum (Volumes 38-41)

Pages:

1463-1468

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.38-41.1463

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Online since:

January 1989

Authors:

G. Papaioannou, V. Ioannou-Sougleridis, S. Cristoloveanu, M. Bruel, P.L.F. Hemment

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© 1989 Trans Tech Publications Ltd. All Rights Reserved

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