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HomeMaterials Science ForumMaterials Science Forum Vols. 38-41

Materials Science Forum Vols. 38-41

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.38-41

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Influence of the Defect Density of Amorphous Silicon at the Substrate Interface on the Schottky Barrier Characteristics

Authors: J.C. van den Heuvel, R.C. van Oort, M.J. Geerts, B. Bokhorst, J.W. Metselaar

1481

Microinhomogeneities Characterized by Photocurrent Measurements and the Sem-Ebic Technique in Alpha-Si:H Layers

Authors: M. Füstöss-Wegner, L. Pogány, Margit Koós, László S. Tóth, G. Zentai

1487