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Materials Science Forum Vols. 38-41

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.38-41

ToC:

Table of Contents

Paper Title Page

Transient Spectroscopy on Individual Defect Levels
Authors: A. Karwath, M. Schulz
1421
Pressure Dependence of Schottky Barrier Height at Pt/GaAs Interface
Authors: W. Shan, Ming Fu Li, P.Y. Yu, W. Walukiewicz, W.L. Hansen
1427
Photoluminescence and Transmision Electron Microscopy of Defects in SiC Grown on Si
Authors: Wolfgang J. Choyke, J. Anthony Powell, T.T. Cheng, P. Pirouz
1433
Deep Levels in GaAs Mesfets
Authors: P. Macháč, V. Pantucek, J. Merta
1439
Defects in MOS Technologies
Authors: D. Korytàr, P. Kavicky, M. Hulman, A. Weissensteiner, L. Tuchscher
1445
Lattice Deformation and Defect Structure of GaAs/Native Oxide Interfaces
Authors: S. Lànyi, M. Wolcyrz, Emil Pinčík, V. Nadazdy
1451
Influence of the Surface Layer Defects on the Conduction Mechanism in Semi-Insulating Gallium Arsenide
Authors: J. Gual, Josep Samitier, A. Pérez-Rodríguez, J.R. Morante, Pierre Boher, M. Renaud
1457
Investigation of Trapping Properities in Simox Films by Photo-Induced Current Transient Spectroscopy
Authors: G. Papaioannou, V. Ioannou-Sougleridis, S. Cristoloveanu, M. Bruel, P.L.F. Hemment
1463
Coherent Potential Approximation Calcutations of the Electronic Structure of Amorphous Silicon
Authors: A.K. Wronski, M.K. Urbanski, S.M. Pietruszko
1469
Influence of the Field Induced Doping Effect on the Density of States in Highly Doped N-Type a-Si:H
Authors: D.L. Huber, G. Zentai
1475

Showing 231 to 240 of 242 Paper Titles

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