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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Influence of Temperature on X-Ray Diffraction...

Influence of Temperature on X-Ray Diffraction Analysis of ZrO₂ Oxide Layers Formed on Zirconium Based Alloys Using a Synchrotron Radiation

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

803-808

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.803

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Online since:

August 2002

Authors:

Jean Luc Béchade, Rénald Brenner, Philippe Goudeau, Marc Gailhanou

Keywords:

In Situ Analysis, Micromechanical Modeling, Oxidation, Residual Stress, Synchrotron Radiation (XRD), Thermal Stress, Zirconium Alloys

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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