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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Measurement of Stress in Phosphated-Iron Oxide...

Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

809-816

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.809

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Online since:

August 2002

Authors:

Benoit Panicaud, Pierre Olivier Renault, Jean Luc Grosseau-Poussard, J.F. Dinhut, D. Thiaudière, Marc Gailhanou

Keywords:

High Temperature Oxidation, Iron, Phosphate Layer, Residual Stress

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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