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Defect Characterization of Barium Titanates, Tantalates and Niobates by PAS and ESR
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Theoretical Study of Positron Annihilation in Nanoclusters in Al-Cu System
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Identities of the Deep Level Defects E₁/E₂ in 6H Silicon Carbide
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Positron Lifetime and Doppler Broadening Study of Defects Created by Swift Ion Irradiation in Sapphire
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The Correlations of Electrochromism and Thermochromism of Tungsten Oxide Films Studied by Slow Positron Beam
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Interface Properties of 4H-SiC MOS Structures Studied by a Slow Positron Beam
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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Positron Lifetime and Doppler Broadening Study of...

Positron Lifetime and Doppler Broadening Study of Defects Created by Swift Ion Irradiation in Sapphire

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

138-140

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.138

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Online since:

January 2004

Authors:

L. Liszkay, Paulo M. Gordo, K. Havancsák, V.A. Skuratov, Adriano P. de Lima, Z. Kajcsos

Keywords:

Al₂O₃, Kr Irradiation, Positron Lifetime, Pulsed Positron Beam, Sapphire, Vacancy

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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