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HomeMaterials Science ForumMaterials Science Forum Vols. 449-452Scanning Electron Microscopy Observations of...

Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films

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Periodical:

Materials Science Forum (Volumes 449-452)

Pages:

445-448

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.449-452.445

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Online since:

March 2004

Authors:

Yuzo Miura, Minoru Doi, Tomokazu Moritani, Makoto Takagi, Toru Imura, Yoshihiko Masuo

Keywords:

Al-Ge, Amorphous, Bilayer Film, Crystallization, Fractal, Ge, In Situ Experiment, Pattern

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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