Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films

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Periodical:

Materials Science Forum (Volumes 449-452)

Edited by:

S.-G. Kang and T. Kobayashi

Pages:

445-448

DOI:

10.4028/www.scientific.net/MSF.449-452.445

Citation:

Y. Miura et al., "Scanning Electron Microscopy Observations of Fractal Pattern Formation in Al/Ge Bilayer Films", Materials Science Forum, Vols. 449-452, pp. 445-448, 2004

Online since:

March 2004

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$35.00

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