Absolute Scale Reciprocal Space Mapping on X-Ray Diffractometers Incorporating a Position Sensitive Detector: Application to III-Nitride Semiconductors

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Periodical:

Materials Science Forum (Volumes 455-456)

Edited by:

Rodrigo Martins, Elvira Fortunator, Isabel Ferreira, Carlos Dias

Pages:

132-136

DOI:

10.4028/www.scientific.net/MSF.455-456.132

Citation:

N. Franco et al., "Absolute Scale Reciprocal Space Mapping on X-Ray Diffractometers Incorporating a Position Sensitive Detector: Application to III-Nitride Semiconductors", Materials Science Forum, Vols. 455-456, pp. 132-136, 2004

Online since:

May 2004

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