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HomeMaterials Science ForumMaterials Science Forum Vols. 455-456Absolute Scale Reciprocal Space Mapping on X-Ray...

Absolute Scale Reciprocal Space Mapping on X-Ray Diffractometers Incorporating a Position Sensitive Detector: Application to III-Nitride Semiconductors

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Advanced Materials Forum II

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Periodical:

Materials Science Forum (Volumes 455-456)

Pages:

132-136

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.455-456.132

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Online since:

May 2004

Authors:

Nuno Franco, Sergio Pereira, A.D. Sequeira

Keywords:

Absolute Scale, Diffractometer Alignment, Multilayer, Reciprocal Space Maps

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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