Investigation of the Primary Recrystallisation Microstructure of Cold Rolled and Annealed Fe 3% Si Single Crystals with Goss Orientation

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A silicon steel single crystal with {110}<001> Goss orientation was cold rolled up to 89 % thickness reduction and subsequently annealed. The evolution of the macroscopic cold rolling texture was investigated by x-ray diffraction. Local orientation relationships and the microstructure around and within Goss grains of deformed and annealed samples were analysed using the electron backscatter diffraction (EBSD) technique. During cold rolling a texture consisting of two strong {111}<112> components and a minor {110}<001> Goss component develops. After primary recrystallisation the texture is characterized by a strong Goss component. Goss-oriented grains that remain after high deformation are considered to be the origin for the primary recrystallisation texture.

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Periodical:

Materials Science Forum (Volumes 467-470)

Edited by:

B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot

Pages:

129-134

Citation:

D. Dorner et al., "Investigation of the Primary Recrystallisation Microstructure of Cold Rolled and Annealed Fe 3% Si Single Crystals with Goss Orientation", Materials Science Forum, Vols. 467-470, pp. 129-134, 2004

Online since:

October 2004

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$38.00

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