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Investigation of the Primary Recrystallisation Microstructure of Cold Rolled and Annealed Fe 3% Si Single Crystals with Goss Orientation
Abstract:
A silicon steel single crystal with {110}<001> Goss orientation was cold rolled up to 89 % thickness reduction and subsequently annealed. The evolution of the macroscopic cold rolling texture was investigated by x-ray diffraction. Local orientation relationships and the microstructure around and within Goss grains of deformed and annealed samples were analysed using the electron backscatter diffraction (EBSD) technique. During cold rolling a texture consisting of two strong {111}<112> components and a minor {110}<001> Goss component develops. After primary recrystallisation the texture is characterized by a strong Goss component. Goss-oriented grains that remain after high deformation are considered to be the origin for the primary recrystallisation texture.
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129-134
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October 2004
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© 2004 Trans Tech Publications Ltd. All Rights Reserved
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