Recrystallization Texture and Microstructure in Ni and AlMg1Mn1 Determined with High-Energy Synchrotron Radiation

Abstract:

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The newly developed “sweeping detector” technique with high energy synchrotron radiation allows to measure textures and microstructures of materials with high location and orientation resolution. This method was applied to hot rolled aluminium manganese alloys and to rolled nickel samples in different recrystallization stages. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. That can be the base for comprehensive recrystallization theories.

Info:

Periodical:

Materials Science Forum (Volumes 467-470)

Edited by:

B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot

Pages:

1379-1384

DOI:

10.4028/www.scientific.net/MSF.467-470.1379

Citation:

H. Klein et al., "Recrystallization Texture and Microstructure in Ni and AlMg1Mn1 Determined with High-Energy Synchrotron Radiation", Materials Science Forum, Vols. 467-470, pp. 1379-1384, 2004

Online since:

October 2004

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$35.00

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