Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study

Abstract:

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The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffraction investigations.

Info:

Periodical:

Materials Science Forum (Volumes 467-470)

Edited by:

B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot

Pages:

1345-1352

DOI:

10.4028/www.scientific.net/MSF.467-470.1345

Citation:

A.A. Rasmussen et al., "Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study", Materials Science Forum, Vols. 467-470, pp. 1345-1352, 2004

Online since:

October 2004

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$35.00

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