Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study
The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffraction investigations.
B. Bacroix, J.H. Driver, R. Le Gall, Cl. Maurice, R. Penelle, H. Réglé and L. Tabourot
A.A. Rasmussen et al., "Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study", Materials Science Forum, Vols. 467-470, pp. 1345-1352, 2004