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Thermal Stability of Electrodeposited Ni and Ni-Co Layers; an EBSD-Study

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Abstract:

The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffraction investigations.

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Periodical:

Materials Science Forum (Volumes 467-470)

Pages:

1345-1352

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.467-470.1345

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Online since:

October 2004

Authors:

A.A. Rasmussen, Ali Gholinia, Patrick W. Trimby, Marcel A.J. Somers

Keywords:

Cobalt, Electro-Deposition, Electron Backscatter Diffraction (EBSD), Microstructure, Nickel Ni

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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