Texture Development of Ni3Al Thin Foils during Recrystallization and Grain Growth

Masahiko Demura; Kyosuke Kishida; Ya Xu; Toshiyuki Hirano

doi:10.4028/www.scientific.net/MSF.467-470.447

Paper Titles

New Grain Formation in a Coarse-Grained 7475 Al Alloy during Severe Hot Forging
p.421

Texture Changes during Uniaxial Compression of Mg-3Al-1Zn
p.429

Effect of Grain Size on the Deformation and Dynamic Recrystallization of Mg-3Al-1Zn
p.435

Grain Growth Texture Evolution in Zirconium (Zr702) and Commercially Pure Titanium (T40)
p.441

Texture Development of Ni₃Al Thin Foils during Recrystallization and Grain Growth
p.447

Experimental Investigations of Recrystallization Texture Development in Zirconium (Zr702)
p.453

The Recrystallization Behaviour of CP-Titanium
p.459

Whisker Growth from Tin Coatings
p.465

Influence of Oxygen Content on the Static Recrystallization of ETP Copper
p.471

HomeMaterials Science ForumMaterials Science Forum Vols. 467-470Texture Development of Ni3Al Thin Foils during...

Texture Development of Ni₃Al Thin Foils during Recrystallization and Grain Growth

Abstract:

The texture evolution of 83% cold-rolled Ni3Al foils during recrystallization was examined through heat treatments at 600 °C, 800 °C, and 1000 °C for 30 min. X-ray texture measurements revealed that the texture changed from the as-rolled Goss to a transitional complicated one by primary recrystallization and eventually returned to the Goss texture during grain growth. The SEM-EBSD analysis revealed that the return to the Goss texture was accompanied by the decrease of random boundaries (RBs) and the increase of S1 boundaries. The preferential growth of the Goss-oriented grains was explained by the difference in the grain boundary energy between the RBs and S1, based on the observed grain-orientation maps.