Non-Destructive Observation of Damage Processes in Loaded High Ductile Specimens with Different Crack Configuration by X-Ray Dynamic Defectoscopy

Abstract:

This work reports on the results of the experimental observation of development and evolution of material damage during loading processes in aluminium alloy flat specimens with different pre-crack configurations by means of the new “X-ray Dynamic Defectoscopy” technique and by plastic strain increments identified by the optical Method of Interpolated Ellipses on the its surface. We have acquired good knowledge about the evolution of damage zone during loading. The dependence of intensity and shape of damage zone on the crack configuration, part of the field previously little investigated experimentally, has been determined.

• Periodical: Materials Science Forum (Volumes 480-481)
• Pages: 231-236
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.480-481.231
• Online since: March 2005
• Authors: D. Vavřík, J. Jakůbek, S. Pospíšil, J. Visschers
• Keywords: Defectoscopy, Digital Roentgenography, Fracture Mechanic, Materials Science, Semiconductor Detector

References

[1] Tvergaard, V.: Material Failure by Void Growth to Coalescence,. Advanced in Appl. Mech., Vol. 27 (1990) 83-150.

[2] Vavřík, D., Optical Identification of Surface Plastic Zone Shape and Size near Crack Tip, Ph.D. Thesis, Czech Technical University, Prague (1999).

[3] Vavřík, D.; T. Holý; Jakůbek, J.; Pospíšil, S.: Tomography for XRDD". Contribution to the Conference "5 th International Workshop on Radiation Imaging Detectors, Riga (2003).

[4] Vavřík, D.; Jakůbek, J.; Ponchut, C.; Pospíšil, S.; Visschers, J.; Zemánková, J.: First tests of Medipix-1 pixel detector for X-ray dynamic Defectoscopy". Contribution to the Conference "3 rd International Workshop on Radiation Imaging Detectors, Sardinia Orosei, 23-27 September 2001. Nucl. Instr. and Meth. in Phys. Res. A487/1-2 (2002).

DOI: 10.1016/s0168-9002(02)00968-3

[5] G. Bardelloni, E. Bertolucci, A.L.J. Boerkamp, D. Calvet, M. Conti, M. Maiorino, P. Russo, J.L. Visschers: A New Read-out System for an Imaging Pixel Detector, Proc. of the IEEE Nuclear Science Symposium and Medical Imaging Conference, Lyon, France, October 15-20 (2000).

DOI: 10.1109/nssmic.2000.949940

[6] http: /www. cern. ch/MEDIPIX.

[7] Vavřík, D.; Jakůbek, J.; Pospíšil, S.; Visschers, J.: Non-destructive Observation of Damage Processes by X-Ray Dynamic Defectoscopy, Proceedings of the 9th International Conference on the Mechanical Behaviour of Materials, Geneva (2003).

DOI: 10.4028/www.scientific.net/msf.480-481.231