Measurement on X-Ray Stress Constant of Beryllium

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Periodical:

Materials Science Forum (Volumes 490-491)

Edited by:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu

Pages:

202-207

Citation:

P. Dong and R. Li, "Measurement on X-Ray Stress Constant of Beryllium", Materials Science Forum, Vols. 490-491, pp. 202-207, 2005

Online since:

July 2005

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[1] AST/X2001-G2 X-ray Stress Analyzer User' Manual. (America Stress Technologies Inc., Pittsburgh(PA) 1995), p.92.

[2] M. Korhonen: On the Improvement of the Accuracy of Stress Measurement by X-ray Camera Methods. (Helsinki university of Technology, Helsinki 1980), p.12.

[3] Y.M. Hong W.H. Xiong: Material Mechanics. (High education press, Beijing 1986), p.200.

[4] Dong Ping, Chen Yuze, Zou Juesheng: Materials Characterization, Vol. 49(2003), p.381.

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