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HomeMaterials Science ForumMaterials Science Forum Vols. 490-491Measurement on X-Ray Stress Constant of Beryllium

Measurement on X-Ray Stress Constant of Beryllium

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Residual Stresses VII, ICRS7

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Periodical:

Materials Science Forum (Volumes 490-491)

Pages:

202-207

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.490-491.202

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Online since:

July 2005

Authors:

Ping Dong, Ruiwen Li

Keywords:

Beryllium, Penetration Depth, X-Ray Stress Constant

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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[1] AST/X2001-G2 X-ray Stress Analyzer User' Manual. (America Stress Technologies Inc., Pittsburgh(PA) 1995), p.92.

[2] M.Korhonen: On the Improvement of the Accuracy of Stress Measurement by X-ray Camera Methods.(Helsinki university of Technology, Helsinki 1980), p.12

[3] Y.M. Hong W.H. Xiong: Material Mechanics. (High education press, Beijing 1986), p.200

[4] Dong Ping, Chen Yuze, Zou Juesheng: Materials Characterization, Vol.49(2003), p.381