Comparative Neutron and Synchrotron X-Ray Diffraction Studies to Determine Residual Stress on an As-Welded AA2024 Plate

Article Preview

Abstract:

The residual stress field in a VPPA welded AA2024 coupon sample was measured by neutron diffraction. A similar sample was measured using synchrotron X-rays to determine the inplane strain directions. The macrostrain obtained from both sources compares well in spite of the significant difference in gauge volume and diffraction geometry. The result confirms the repeatability of the weld process and also shows good correspondence between the two diffraction processes.

You might also be interested in these eBooks

Info:

Periodical:

Materials Science Forum (Volumes 490-491)

Pages:

223-228

Citation:

Online since:

July 2005

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2005 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] A. Heinz, A. Haszler, C. Keidel, S. Moldenhauer, R. Benedictus, and W.S. Miller: Materials Science and Engineering, 2000. A280: pp.102-107.

DOI: 10.1016/s0921-5093(99)00674-7

Google Scholar

[2] I.C. Noyan and J.B. Cohen: Residual stress - Measurement by diffraction and interpretation. (Springer-Verlag, New York 1987).

Google Scholar

[3] G.L. Serrano. Variable polarity plasma arc welding(VPPAW) of 12. 5mm thick AA-2024 T351, AA-7150 T651 and AA-7150 W51. in 2nd International conference on recent developments and future trends in welding technology. 2003. Kings Norton Library, Cranfield University.

Google Scholar

[4] B. Clausen, T. Lorentzen, and T. Leffers: Acta Mater, 1998. 46: pp.3087-3098.

Google Scholar

[5] V. Hauk: Structural and Residual Stress Analysis by Non-destructive Method. (Elsevier, 1977).

Google Scholar

[6] T. Lorentzen, Anisotropy of Lattice Strain Response, in Analysis of Residual Stresses by Diffraction Using Neutron and Synchrotron Radiation, M.E. Fitzpatrick and A. Lodini, Editors. 2003, Taylor and Francis: London. pp.114-130. a) b).

DOI: 10.1201/9780203608999.ch7

Google Scholar