A New Method for Measuring Residual Stress Relaxation during Nanoindentation

Abstract:

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The work of nanoindentation approach is developed and applied for measure of residual stress relaxation during indenter penetrates in thin films. The residual stress at given penetration depth is measured from the different integral area which under load-depth curve of different stress state. This method can measure residual stress relaxation without the need for estimating yield strength, strain hardening index and hardness.

Info:

Periodical:

Materials Science Forum (Volumes 490-491)

Edited by:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu

Pages:

213-217

DOI:

10.4028/www.scientific.net/MSF.490-491.213

Citation:

F. Wang and K. W. Xu, "A New Method for Measuring Residual Stress Relaxation during Nanoindentation", Materials Science Forum, Vols. 490-491, pp. 213-217, 2005

Online since:

July 2005

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Price:

$35.00

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