Residual Stress Analysis in Both As-Deposited and Annealed CrN Coatings

Abstract:

Article Preview

In this paper, we report on residual stress analysis in physical vapour deposited (PVD) CrN coatings. Two 9 µm thick coatings were grown on tool steel substrates with bias voltages of - 50 V and -300 V, respectively. High-energy (E=80 keV) synchrotron radiation measurements have been performed to investigate residual stresses in both as-deposited and annealed CrN coatings. To understand the origins of non-linear distribution of lattice strain versus sin2ψ for certain (hkl) planes in both coatings, a stress orientation distribution function (SODF) analysis has been carried out, which yields grain-orientation-dependent residual stresses. The results are compared to previous analyses using Reuss and Vook-Witt models on the as-deposited coatings.

Info:

Periodical:

Materials Science Forum (Volumes 490-491)

Edited by:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu

Pages:

643-648

DOI:

10.4028/www.scientific.net/MSF.490-491.643

Citation:

R. L. Peng et al., "Residual Stress Analysis in Both As-Deposited and Annealed CrN Coatings", Materials Science Forum, Vols. 490-491, pp. 643-648, 2005

Online since:

July 2005

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.