Evaluation of Residual Stress in Nano-TiO2 Film on ITO Glass by Synchrotron X-Ray Diffraction
p.637
p.637
Residual Stress Analysis in Both As-Deposited and Annealed CrN Coatings
p.643
p.643
Sensitivity of a Rotating Beam Sensor for Stress Evaluation in Aluminium Thin Films
p.649
p.649
Delamination and Buckling Induced by Compressive Strain in Metal Thin Films
p.655
p.655
Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays
p.661
p.661
Testing and Analysis of the Inner Stress in Adhesive Coating Layer Using Strain Gauges and Finite Element Method
p.667
p.667
Application of the White/Monochromatic X-Ray μ-Diffraction Technique to the Study of Texture and Triaxial Strain at the Submicron Level
p.672
p.672
X-Ray Measurements of Residual Stress Distribution in TiN Thin Films with Fiber Texture
p.678
p.678
XRD Stress Analysis in a TiAl Based Intermetallic Multicrystal
p.684
p.684
Residual Stress Measurement in Sputtered Copper Thin Films by Synchrotron Radiation and Ordinary X-Rays
Abstract:
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Periodical:
Materials Science Forum (Volumes 490-491)
Pages:
661-666
Citation:
Online since:
July 2005
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Сopyright:
© 2005 Trans Tech Publications Ltd. All Rights Reserved
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