Application of the White/Monochromatic X-Ray μ-Diffraction Technique to the Study of Texture and Triaxial Strain at the Submicron Level

Abstract:

A scanning X-ray microdiffraction beamline using white or monochromatic beam has been recently made available to the user’s community at the Advanced Light Source, Berkeley, USA. Samples are scanned under an X-ray beam with size ranging from 15 microns down to less than a micron, and 2D diffraction patterns are collected at each step. A specifically written software allows for the full treatments of these patterns to obtain as outputs high spatial resolution grain orientation, strain/stress or mineral species distribution maps. The range of applications of this technique goes from the study of the mechanical properties of thin films to the understanding of trace elements speciation in environmental sciences.

• Periodical: Materials Science Forum (Volumes 490-491)
• Pages: 672-677
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.490-491.672
• Online since: July 2005
• Authors: Philippe Goudeau, Nobumichi Tamura, R. Spolenak, H.A. Padmore
• Keywords: Microfocus, Microstructure, Residual Stress, Synchrotron Radiation (XRD), Texture, Thin Film, X-Ray Diffraction (XRD)

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