Impact of Local Texture on Recrystallization and Grain Growth via In Situ EBSD

Abstract:

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While electron backscatter diffraction (EBSD) has become an established technique within materials characterization labs around the world, the technique is still relatively young and new applications are continuing to emerge. Automated EBSD or Orientation Imaging Microscopy (OIM) systems are being used in combination with other equipment within the scanning electron microscope (SEM) to perform in-situ measurements. This includes tensile stages for observing changes in local orientation during deformation and heating stages for studying orientation changes arising during recrystallization and grain growth as well as phase transformations. In addition to these temporally three-dimensional studies, spatially three-dimensional studies can be performed by in-situ serial sectioning in microscopes equipped with both electron and focused ion beams. These in-situ techniques are briefly reviewed. The review is followed by a detailed analysis of in-situ heating experiments on copper. The movement of grain boundaries during recrystallization and subsequent grain growth are tracked. The effect of orientation relationships on grain boundary mobility and nucleation are explored. No special relationship with grain boundary mobility was observed. However, twins appear to play a significant role in the nucleation process.

Info:

Periodical:

Materials Science Forum (Volumes 495-497)

Edited by:

Paul Van Houtte and Leo Kestens

Pages:

1121-1130

DOI:

10.4028/www.scientific.net/MSF.495-497.1121

Citation:

S. I. Wright et al., "Impact of Local Texture on Recrystallization and Grain Growth via In Situ EBSD", Materials Science Forum, Vols. 495-497, pp. 1121-1130, 2005

Online since:

September 2005

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Price:

$35.00

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