EDS Assisted Phase Differentiation in Orientation Imaging Microscopy

Stuart I. Wright; Matthew M. Nowell

doi:10.4028/www.scientific.net/MSF.509.11

Paper Titles

Multiscale Approach to Texture-Microstructure Coupling
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EDS Assisted Phase Differentiation in Orientation Imaging Microscopy
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Microstructural Evolution of a Commercial 0.04%C Steel During Batch Annealing
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Characterization of Global and Local Textures in Hot Rolled CGO Fe3%Si
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Mechanical Properties of Ultra Clean Low C/Cr Stabilized Annealed Sheets
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Determination of the Work Hardening Exponent by the Hollomon and Differential Crussard-Jaoul Analyses of Cold Drawn Ferrite-Pearlite Steels
p.37

Microstructure and Self-Affine Fracture Surface Parameters in Steel
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Dislocation Mechanisms and Plasticity of Quasicrystals: TEM Observations in Icosahedral AlPdMn
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In Situ Deformation at 850°C of Standard and Rafted Microstructures of Nickel Base Superalloys
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HomeMaterials Science ForumMaterials Science Forum Vol. 509EDS Assisted Phase Differentiation in Orientation...

EDS Assisted Phase Differentiation in Orientation Imaging Microscopy

Abstract:

Automated Electron Backscatter Diffraction (EBSD) or Orientation Imaging Microscopy (OIM) has proven to be a viable technique for investigating microtexture in polycrystalline materials. It is particularly useful for investigating orientation relationships between phases in multiphase materials. However, when phases do not significantly vary in crystallographic structure, OIM is limited in its capability to reliably differentiate between phases. Through simultaneous collection of EBSD data and chemical data via X-Ray Energy Dispersive Spectroscopy (EDS) it is possible to dramatically improve upon the phase differentiation capabilities of either technique individually. This presentation will introduce a methodology for combining the two techniques as well as show a few example applications.

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Periodical:

Materials Science Forum (Volume 509)

Pages:

11-16

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.509.11

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Online since:

March 2006

Authors:

Stuart I. Wright, Matthew M. Nowell

Keywords:

EDS, Electron Backscatter Diffraction (EBSD), Orientation Image Microscopy (OIM), Orientation Imaging Microscopy, Phase Differentiation, X-Ray Energy Dispersive Spectroscopy

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