Inter- and Intragranular Stress Determination with Kossel Microdiffraction in a Scanning Electron Microscope

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Abstract:

A Kossel microdiffraction experimental set up is under development inside a Scanning Electron Microscope (SEM) in order to determine the crystallographic orientation as well as the inter- and intragranular strains and stresses on the micron scale, using a one cubic micrometer spot. The experimental Kossel line patterns are obtained by way of a CCD camera and are then fully indexed using a home-made simulation program. The so-determined orientation is compared with Electron Back-Scattered Diffraction (EBSD) results, and in-situ tests are performed inside the SEM using a tensile/compressive machine. The aim is to verify a 50MPa stress sensitivity for this technique and to take advantage from this microscope environment to associate microstructure observations (slip lines, particle decohesion, crack initiation) with determined stress analyses.

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Periodical:

Materials Science Forum (Volumes 524-525)

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109-114

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Online since:

September 2006

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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