An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

A. Kumar; U. Welzel; M. Wohlschlögel; W. Baumann; Eric Jan Mittemeijer

doi:10.4028/www.scientific.net/MSF.524-525.13

Paper Titles

The Importance of Residual Stresses in Microelectronic Products and Materials
p.1

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth
p.13

Mechanical Stress Gradients in Thin Films Analyzed Employing X-Ray Diffraction Measurements at Constant Penetration/Information Depths
p.19

Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods
p.25

Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part I: Angle-Dispersive Approach
p.31

Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach
p.37

The Residual Stresses Generated by Deep Rolling and their Stability in Fatigue & Application to Deep-Rolled Crankshafts
p.45

Stability of Residual Stresses of Deep Rolled Sintered Iron at Quasistatic and Cyclic Loading
p.51

Residual Stress Stability in High Temperature Fatigued Mechanically Surface Treated Metallic Materials
p.57

HomeMaterials Science ForumMaterials Science Forum Vols. 524-525An X-Ray Diffraction Method to Determine Stress at...

An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

Abstract:

A rigorous strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths is described. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of accessible penetration/information depths and experimental aspects are briefly discussed. The power of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited nickel layer.

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Materials Science Forum (Volumes 524-525)

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13-18

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.524-525.13

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Online since:

September 2006

Authors:

A. Kumar, U. Welzel, M. Wohlschlögel, W. Baumann, Eric Jan Mittemeijer

Keywords:

Information Depth, Penetration Depth, Stress Gradient

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