An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth

Abstract:

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A rigorous strategy for (X-ray) diffraction stress measurements at fixed penetration/information depths is described. Thereby errors caused by lack of penetration-depth control in traditional (X-ray) diffraction (sin2ψ) measurements are annulled. The ranges of accessible penetration/information depths and experimental aspects are briefly discussed. The power of the method is illustrated by the analysis of an only small stress gradient in a sputter-deposited nickel layer.

Info:

Periodical:

Materials Science Forum (Volumes 524-525)

Edited by:

W. Reimers and S. Quander

Pages:

13-18

DOI:

10.4028/www.scientific.net/MSF.524-525.13

Citation:

A. Kumar et al., "An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth ", Materials Science Forum, Vols. 524-525, pp. 13-18, 2006

Online since:

September 2006

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Price:

$35.00

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