Determination of Real Space Residual Stress Distributions σij(z) of Surface Treated Materials with Diffraction Methods Part I: Angle-Dispersive Approach

Thorsten Manns; Jens Gibmeier; Berthold Scholtes

doi:10.4028/www.scientific.net/MSF.524-525.31

Paper Titles

The Importance of Residual Stresses in Microelectronic Products and Materials
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An X-Ray Diffraction Method to Determine Stress at Constant Penetration/Information Depth
p.13

Mechanical Stress Gradients in Thin Films Analyzed Employing X-Ray Diffraction Measurements at Constant Penetration/Information Depths
p.19

Sub-Surface Residual Stress Gradients: Advances in Laboratory XRD Methods
p.25

Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part I: Angle-Dispersive Approach
p.31

Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part II: Energy Dispersive Approach
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The Residual Stresses Generated by Deep Rolling and their Stability in Fatigue & Application to Deep-Rolled Crankshafts
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Stability of Residual Stresses of Deep Rolled Sintered Iron at Quasistatic and Cyclic Loading
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Residual Stress Stability in High Temperature Fatigued Mechanically Surface Treated Metallic Materials
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HomeMaterials Science ForumMaterials Science Forum Vols. 524-525Determination of Real Space Residual Stress...

Determination of Real Space Residual Stress Distributions σ_ij(z) of Surface Treated Materials with Diffraction Methods Part I: Angle-Dispersive Approach

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Materials Science Forum (Volumes 524-525)

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31-36

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https://doi.org/10.4028/www.scientific.net/MSF.524-525.31

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Online since:

September 2006

Authors:

Thorsten Manns, Jens Gibmeier, Berthold Scholtes

Keywords:

Angle Dispersive, Beam Limiting Masks, Real Space Method, Residual Stress Gradients

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