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HomeMaterials Science ForumMaterials Science Forum Vols. 539-543Texture Memory Effect in Heavily Cold-Rolled Ni3Al...

Texture Memory Effect in Heavily Cold-Rolled Ni₃Al Single Crystals

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Abstract:

The paper presented the texture evolution during primary recrystallization and following grain growth in the heavily cold-rolled Ni3Al single crystals. It turned out that the texture evolution occurred in the two stages. First, primary recrystallization caused the drastic change of the as-rolled texture. Then, as grain growth proceeded, the texture returned to the same one as the as-rolled textures. This texture return can be designated as Texture memory effect. The mechanism of the texture memory effect was discussed based on the analysis of the orientation relationship between the as-rolled and the primary recrystallization textures.

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THERMEC 2006

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Periodical:

Materials Science Forum (Volumes 539-543)

Pages:

1513-1518

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.539-543.1513

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Cite this paper

Online since:

March 2007

Authors:

Masahiko Demura, Ya Xu, Toshiyuki Hirano

Keywords:

Electron Backscatter Diffraction Method, Grain Growth, Intermetallic Compound (IMC), Oriented Growth, Pole Figure Measurement, Recrystallization

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