A New Technique for Characterization of Residual Stresses in Glass Surfaces: Scratch Test Completed with Image Analysis

Szilvia Szeghalmy; Péter Barkóczy; Maria Berkes Maros; Attila Fazekas; Csaba Póliska

doi:10.4028/www.scientific.net/MSF.589.275

Paper Titles

Hyperbolic Model Based Data Evaluation for Magnetic NDE Measurements
p.251

Atomic Force Microscopy Studies of Alkyl-Phosphonate SAMs on Mica
p.257

The Examination of Weld Line Properties in Injection Molded PP Composites
p.263

Preparation of MWCNT/Carbon Fabric Reinforced Hybrid Nanocomposite and Examination of its Mechanical Properties
p.269

A New Technique for Characterization of Residual Stresses in Glass Surfaces: Scratch Test Completed with Image Analysis
p.275

Investigation of Time-Dependent Behavior of Starch-Based, Injection Molded Biodegradable Polymer
p.281

Evaluation of Microgravity Heat Conductivity Measurements with FLUENT System
p.287

Equations and Verification of New Diffusion Parameters
p.293

Transformation of Temperature and Time Diagrams Constructed by Different Time Intervals Applying the Newton Formula
p.299

HomeMaterials Science ForumMaterials Science Forum Vol. 589A New Technique for Characterization of Residual...

A New Technique for Characterization of Residual Stresses in Glass Surfaces: Scratch Test Completed with Image Analysis

Abstract:

Residual stresses significantly influence the strength and lifetime of the glass products, therefore their qualification and quantification during production is basically important for evaluating their probable reliability in application. The current paper aims at introducing a novel procedure of the suggested automatic glass quality test based on instrumented scratch test completed with computer aided image analysis. A special emphasis is put on the problem of limited reproducibility and reliability of the image processing, arisen in the first stage of the research work. The latest results consisting in the development of a new algorithm, providing a more reliable evaluation of the test data will be described.