Preface
Nanocrystal Non-Volatile Memory Devices
p.1
p.1
On Similar Electrical, Optical and Structural Properties of MOS Structures Prepared on a-Si:H/c-Si, Porous Silicon/c-Si, and c-Si
p.11
p.11
Sm1-xNdxNiO3 Thin Films Deposition by KrF Laser Ablation
p.27
p.27
Problems with Synthesis of Chalcopyrite CuIn1-xBxSe2
p.33
p.33
Phase Explosion in Silicon and Titanium Targets Irradiated by Third Harmonic Nd-YAG Pulsed Laser
p.37
p.37
Optical Properties of the Strained Layer Superlattices (GaAs)6/(GaP)m(001) (m=2, 4 and 6)
p.41
p.41
Characterization of a-C:H Thin Films Deposited from C2H4 by PECVD Microwave Discharge
p.49
p.49
Thin Layered Structures Analysis Using NUR Reflectometer
p.53
p.53
Preface
Abstract:
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Info:
Periodical:
Materials Science Forum (Volume 609)
Online since:
January 2009
Сopyright:
© 2009 Trans Tech Publications Ltd. All Rights Reserved
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