Characterisation of Ti/Al Multilayered Structures with Slow Positron Beams Applying a Simplified Positron Depth Distribution Model

Abstract:

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In this work the depth of interfaces in multilayered structures was estimated. The fractions of positron annihilation as function of the implantation energy were estimated from an S-W plot and then converted into a function of the sample depth through the positron implantation profile in the multilayer system computed from a reduced positron profile. The results of this method in Ti/Al samples are comparable to those using the common analysis based on positron diffusion equations. The positron analyses results were compared with SIMS profiles for the same samples.

Info:

Periodical:

Materials Science Forum (Volumes 636-637)

Edited by:

Luís Guerra ROSA and Fernanda MARGARIDO

Pages:

1097-1101

DOI:

10.4028/www.scientific.net/MSF.636-637.1097

Citation:

M. Duarte Naia et al., "Characterisation of Ti/Al Multilayered Structures with Slow Positron Beams Applying a Simplified Positron Depth Distribution Model", Materials Science Forum, Vols. 636-637, pp. 1097-1101, 2010

Online since:

January 2010

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$35.00

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