Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films

N. Muñoz Aguirre; J. Eduardo Rivera-López; L. Martínez Pérez; Pedro A. Tamayo Meza

doi:10.4028/www.scientific.net/MSF.644.109

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HomeMaterials Science ForumMaterials Science Forum Vol. 644Synthesis and Atomic Force Microscopy Contact...

Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films

Abstract:

Aluminum doped ZnO thin films were synthesized by the water-mist assisted spray pyrolysis technique. The structural characterization by means of X-Ray diffraction measurements is reported. By means of Atomic Force Microscopy, the superficial electrical characteristics of the thin films are studied. Specifically, contact current images are shown and discussed. It is important to emphasize that in spite of no voltage is applied to the Atomic Force Microscopy contact conductive tip, current images are getting.

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Materials Science Forum (Volume 644)

Pages:

109-112

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.644.109

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Online since:

March 2010

Authors:

N. Muñoz Aguirre, J. Eduardo Rivera-López, L. Martínez Pérez, Pedro A. Tamayo Meza

Keywords:

Atomic Force Microscope (AFM), C-AFM, ZnO Thin Film

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References

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