Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films

Abstract:

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Aluminum doped ZnO thin films were synthesized by the water-mist assisted spray pyrolysis technique. The structural characterization by means of X-Ray diffraction measurements is reported. By means of Atomic Force Microscopy, the superficial electrical characteristics of the thin films are studied. Specifically, contact current images are shown and discussed. It is important to emphasize that in spite of no voltage is applied to the Atomic Force Microscopy contact conductive tip, current images are getting.

Info:

Periodical:

Edited by:

Arturo Ponce and Darío Bueno

Pages:

109-112

DOI:

10.4028/www.scientific.net/MSF.644.109

Citation:

N. Muñoz Aguirre et al., "Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films", Materials Science Forum, Vol. 644, pp. 109-112, 2010

Online since:

March 2010

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$35.00

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