Grain Tracking at the High Energy Materials Science Beamline of the Petra III Synchrotron Radiation Source

Andrew King; Norbert Schell; René V. Martins; Felix Beckmann; Hans Ulrich Ruhnau; Rüdiger Kiehn; T. James Marrow; Wolfgang Ludwig; Andreas Schreyer

doi:10.4028/www.scientific.net/MSF.652.70

Paper Titles

Numerical Modeling of Residual Stress and Prediction of Heat Affected Zone Induced by PTA Process
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Through-Thickness Residual Stress Measurement by Neutron Diffraction in Cu+W Plasma Spray Coatings
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Residual Strain Profiles in Alumina-Zirconia Ceramic Composites
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Measuring Type II Stresses Using 3DXRD
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Grain Tracking at the High Energy Materials Science Beamline of the Petra III Synchrotron Radiation Source
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Full Depth-Resolved Strain Mapping of a Three-Pass Slot Weld Specimen in Austenitic Stainless Steel Using the Spiral Slit Technique
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Precise Determination of Residual Stresses in Large Specimens by Neutron Diffraction
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Kowari - OPAL's New Stress Diffractometer for the Engineering Community: Capabilities and First Results
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A Challenge for a High-Resolution Ag-In-Cd Decoupler in Intensified Short-Pulsed Neutron Source
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HomeMaterials Science ForumMaterials Science Forum Vol. 652Grain Tracking at the High Energy Materials...

Grain Tracking at the High Energy Materials Science Beamline of the Petra III Synchrotron Radiation Source

Abstract:

Grain tracking is a term used to describe experiments that investigate polycrystalline materials in terms of the crystallites or grains from which they are composed, non-destructively and in three dimensions. The new German high brilliance synchrotron radiation source, Petra III, will become available to users in 2010 [1]. The GKSS research centre will operate two beamlines, including the high energy materials science beamline (HEMS) [2]. HEMS will feature an instrument dedicated to grain tracking, able to support a range of experiments of this kind. This paper describes the design and specification of this instrument, and gives examples of the types of experiments that will be possible.

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Periodical:

Materials Science Forum (Volume 652)

Pages:

70-73

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.652.70

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Online since:

May 2010

Authors:

Andrew King, Norbert Schell, René V. Martins, Felix Beckmann, Hans Ulrich Ruhnau, Rüdiger Kiehn, T. James Marrow, Wolfgang Ludwig, Andreas Schreyer

Keywords:

3DXRD, Diffraction Contrast Tomography, Graintracking, Synchrotron

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References

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