Residual Strain Profiles in Alumina-Zirconia Ceramic Composites

Abstract:

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Residual strain profiles were measured by synchrotron X-ray radiation in Al2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions. Different behaviour is observed for the strains along the in-plane and normal directions.

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Periodical:

Edited by:

Y. Akiniwa, K. Akita and H. Suzuki

Pages:

57-62

DOI:

10.4028/www.scientific.net/MSF.652.57

Citation:

J. Ruiz-Hervias et al., "Residual Strain Profiles in Alumina-Zirconia Ceramic Composites", Materials Science Forum, Vol. 652, pp. 57-62, 2010

Online since:

May 2010

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Price:

$35.00

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