Residual Strain Profiles in Alumina-Zirconia Ceramic Composites

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Abstract:

Residual strain profiles were measured by synchrotron X-ray radiation in Al2O3/Y-stabilized ZrO2 (YSZ) ceramic laminates. Different stacking sequences were employed, including alternating layers containing 5 and 40 vol.% YSZ. Residual strains were found to be fairly constant within each layer; although they change at the interface between layers with different compositions. Different behaviour is observed for the strains along the in-plane and normal directions.

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57-62

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May 2010

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© 2010 Trans Tech Publications Ltd. All Rights Reserved

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